Xu X, Li M, Li S, Cui A, Deng M, Jiang K, Zhu L, Shang L, Chu J H, Hu Z
The Nanoscale Electrical Damage Mechanism of Ge₂Sb₂Te₅ Phase-Change Films Discovered by Conductive Atomic Force Microscopy
IEEE Electron Device Letters, 2023, 44: 488-491.
Xu X, Li M, Li S, Cui A, Deng M, Jiang K, Zhu L, Shang L, Chu J H, Hu Z
The Nanoscale Electrical Damage Mechanism of Ge₂Sb₂Te₅ Phase-Change Films Discovered by Conductive Atomic Force Microscopy
IEEE Electron Device Letters, 2023, 44: 488-491.