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Probing resistive switching in HfO2/Al2O3 bilayer oxides using in-situ transmission electron microscopy

2024-09-29

    Ranjan A, Xu H, Wang C, Molina J, Wu X, Zhang H, Sun L, Chu J H, Pey K L
    Probing resistive switching in HfO2/Al2O3 bilayer oxides using in-situ transmission electron microscopy
    Applied Materials Today, 2023, 31: 101739.

    | 标签: 传感器