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High bias stability of Hf-doping-modulated indium oxide thin-film transistors

2024-09-30

    Li W, Gao C, Li X, Yang J, Zhang J, Chu J H
    High bias stability of Hf-doping-modulated indium oxide thin-film transistors
    Microelectronic Engineering, 2024, 286: 112142.

    | 标签: 传感器