Li W, Gao C, Li X, Yang J, Zhang J, Chu J H
High bias stability of Hf-doping-modulated indium oxide thin-film transistors
Microelectronic Engineering, 2024, 286: 112142.
Li W, Gao C, Li X, Yang J, Zhang J, Chu J H
High bias stability of Hf-doping-modulated indium oxide thin-film transistors
Microelectronic Engineering, 2024, 286: 112142.