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Nanoelectrical monitoring the nonvolatile behavior of VO2 under multi-field stimulate by conductive atomic force microscopy

2024-09-30

    Xu X, Wang L, Li S, Cui A, Deng M, Hou Z, Jiang K, Zhu L, Shang L, Chu J H
    Nanoelectrical monitoring the nonvolatile behavior of VO2 under multi-field stimulate by conductive atomic force microscopy
    Materials Letters, 2024, 363: 136236.

    | 标签: 传感器