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Wafer-scale Te thin film with high hole mobility and piezoelectric coefficients

2024-09-30

    Tai X, Zhao Q, Chen Y, Jiao H, Wu S, Zhou D, Huang X, Xiong K, Lin T, Meng X, Wang X, Shen H, Chu J H, Wang J
    Wafer-scale Te thin film with high hole mobility and piezoelectric coefficients
    Applied Physics Letters, 2024, 125(6).

    | 标签: 传感器